'Eero Saarinen: A Reputation for Innovation' Exhibition

Taking place now until June 30 at the Museum of Design Atlanta, the 'Eero Saarinen: A Reputation for Innovation' exhibition pays tribute to Saarinen’s brief yet brilliant career, in which he designed numerous corporate, educational, cultural, public, and private buildings, including recognizable icons like the Saint Louis Gateway Arch, the TWA Terminal at New York’s JFK Airport, and Dulles Airport in Washington DC. Also breaking new ground by shedding light on a little known chapter of Saarinen’s secret professional life during World War II, the exhibit highlights the architect’s work and a study of the design principles he followed. For more information, please visit here.

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Cite: "'Eero Saarinen: A Reputation for Innovation' Exhibition" 21 Apr 2013. ArchDaily. Accessed . <https://www.archdaily.com/362248/eero-saarinen-a-reputation-for-innovation-exhibition> ISSN 0719-8884

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